MONTGOMERYVILLE, Pa., Dec. 19, 2013 /PRNewswire-iReach/ -- Microtrac, the global pioneer of instrumentation and services for particle characterization is proud to introduce the Nanotrac Wave Q, a dynamic light scattering particle size analyzer with a cuvette sample cell. The Nanotrac Wave Q is the latest in a long line of innovative dynamic light scattering instruments from Microtrac.
Engineered with the end user in mind, the Nanotrac Wave Q has integrated a host of features that enable the operator to quickly and efficiently measure the particle size of a variety of materials. The cuvette sample cell is ideal for users who are concerned with keeping their materials contamination free or need to analyze a large batch of materials in a short amount of time.
What sets the Nanotrac Wave Q apart from other cuvette sample cell particle analyzers is the adapted probe technology. The combination of the focused laser beam with high signal, sample cell, and detector orientation enables the Nanotrac Wave Q to clearly distinguish between scattering patterns and noise from small particles that often confuse other DLS particle size analyzers. This ability allows the Nanotrac Wave Q to measure the size of particles under 20 nanometers with unsurpassed accuracy and repeatability. The Nanotrac Wave Q can measure particles ranging in size from 0.8 to 6500 nanometers.
"With the launch of the "Q" we were able to bring proven DLS technology that Microtrac pioneered to a cuvette instrument," says Dr. Paul Freud, Senior Research and Development Scientist. Dr. Freud continues, "Our patented approach enables us to measure a full particle size distribution over a wide range of concentrations in every measurement."
The Nanotrac Wave Q utilizes the patented Controlled Reference Method, which enables users to measure materials with a wide concentration range that spans from 0.01% to 40%. An additional feature of the Nanotrac Wave Q is the ability to measure molecular weight ranging from <300Daltons to >20×106Daltons, which provides valuable information on the material being analyzed. Equipped with a Peltier temperature control device, users can gain a thorough understanding of how temperature affects the material being measured.
Software upgrades made exclusively for the Nanotrac Wave Q provide users with peace of mind and allows them to focus on what matters; measuring particles. The Nanotrac Wave Q does not require a user to perform a "set zero," (blank measurement) simply load your material and begin analysis. Additionally, no advanced knowledge of the particle size distribution is required. Cuvette error detection alerts notifies users to double-check the cuvette, helping to alleviate any pre-measurement anxiety.
To learn more about the unique features and benefits of the Nanotrac Wave Q, please visit Microtrac.com/nanotrac-wave-q
More than just a manufacturer of particle characterization instruments, Microtrac provides answers to the difficult questions raised by the material science community by designing, manufacturing and selling innovative instrumentation and delivering customer centric solutions.
Established in the 1970's, Microtrac, the global pioneer of particle characterization has established a strong reputation with customers by offering an instrument portfolio that measures particle size, particle shape, zeta potential, surface characterization, particle charge and molecular weight. In addition, Microtrac utilizes its high quality products and expertise in the delivery of analytical services that consistently exceed customer expectations. Microtrac supplies systems across a variety of industries including Pharmaceutical, Chemicals, Life Sciences, Inks, Paints, Food, Powders, and Academia among others. With a global distribution network, Microtrac is always ready to serve your material characterization needs.
Media Contact: Jason Noga, Microtrac, 267-337-3952, email@example.com
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